The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2019

The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits

Domains

Micro and nanotechnologies/Microelectronics

Florence Azais  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-02375866

Submitted on : Friday, November 22, 2019-11:29:35 AM

Last modification on : Friday, March 24, 2023-2:53:13 PM

No file

Dates and versions

lirmm-02375866 , version 1 (22-11-2019)

Identifiers

  • HAL Id : lirmm-02375866 , version 1

Cite

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits. SETS 2019 - South European Test Seminar, 2019, Pitztal, Austria. ⟨lirmm-02375866⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS LIRMM TEST SMARTIES LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
67 View
0 Download

Share

More