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The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits

Hassan El Badawi 1 Florence Azaïs 1 Serge Bernard 2 Mariane Comte 1 Vincent Kerzérho 2 François Lefevre 3
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-02375866
Contributor : Florence Azais <>
Submitted on : Friday, November 22, 2019 - 11:29:35 AM
Last modification on : Friday, March 27, 2020 - 1:56:03 PM

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  • HAL Id : lirmm-02375866, version 1

Citation

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits. South European Test Seminar (SETS), 2019, Pitztal, Austria. ⟨lirmm-02375866⟩

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