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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

Abstract : In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025721
Contributor : Luigi Dilillo <>
Submitted on : Thursday, November 26, 2020 - 1:40:50 PM
Last modification on : Monday, June 28, 2021 - 9:38:01 AM

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Lucas Matana Luza, Daniel Soderstrom, Helmut Puchner, Ruben Garcia Alia, Manon Letiche, et al.. Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM. 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩. ⟨lirmm-03025721⟩

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