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Conference Papers Year : 2020

Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

Abstract

In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.
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Dates and versions

lirmm-03025721 , version 1 (28-09-2021)

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Lucas Matana Luza, Daniel Soderstrom, Helmut Puchner, Ruben Garcia Alia, Manon Letiche, et al.. Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM. DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩. ⟨lirmm-03025721⟩
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