Skip to Main content Skip to Navigation
Journal articles

Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low Power and Low-Orbit Aerospace Applications

Abstract : To meet the requirements of both high reliability and low power in low-orbit aerospace applications, this article first presents a single-event Double-Upset (SEDU) self-Recoverable and single-event Transient (SET) Pulse Filterable (DURTPF) latch design with low power. The DURTPF latch mainly consists of eight mutually feeding-back C-elements (CEs) and an SET pulse filterable Schmitt-trigger (ST). To make an ST behave not only as a pulse filterable ST but also as an error interceptive CE, an input-split ST is created, leading to an enhanced-version of the DURTPF latch, namely DURTPF-EV. The DURTPF-EV latch mainly consists of seven mutually feeding-back CEs including an input-split ST. Simulation results demonstrate both the SEDU self-recoverability and SET pulse filterability of the proposed latches at the cost of moderate silicon area. Using the clock gating technology, the DURTPF latch reduces power dissipation by about 63% on average compared with the state-of-the-art SEDU self-recoverable latch designs that are not SET-pulse filterable. Moreover, the DURTPF-EV latch is more cost-effective and its reliability is also enhanced, making it more suitable for low power and low-orbit aerospace applications.
Complete list of metadata

https://hal-lirmm.ccsd.cnrs.fr/lirmm-03031912
Contributor : Isabelle Gouat <>
Submitted on : Monday, November 30, 2020 - 4:44:01 PM
Last modification on : Tuesday, December 1, 2020 - 3:49:54 PM
Long-term archiving on: : Monday, March 1, 2021 - 7:47:26 PM

File

09043721.pdf
Files produced by the author(s)

Identifiers

Collections

Citation

Aibin Yan, Yan Chen, Zhelong Xu, Zhili Chen, Jie Cui, et al.. Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low Power and Low-Orbit Aerospace Applications. IEEE Transactions on Aerospace and Electronic Systems, Institute of Electrical and Electronics Engineers, 2020, 56 (5), pp.3931-3940. ⟨10.1109/TAES.2020.2982341⟩. ⟨lirmm-03031912⟩

Share

Metrics

Record views

47

Files downloads

74