A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2021

A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments

Aibin Yan
Aoran Cao
  • Function : Author
  • PersonId : 1113360
Zhelong Xu
  • Function : Author
  • PersonId : 1083518
Tianming Ni
Xiaoqing Wen

Abstract

This paper proposes a 4-node-upset (4NU) recoverable and high-impedance-state (HIS) insensitive latch design, namely QRHIL, for highly robust computing in harsh radiation environments. The latch mainly comprises a 5×5 looped C-element matrix to store values and provide complete 4NU recovery. Owing to the multiple-level error-interception of the 5×5 C-element matrix, the latch can recover from all possible 4NUs; thus, the latch is insensitive to HIS. Simulation results demonstrate the 4NU-recovery of the proposed latch. The results also show that the latch can approximately save 46% D-Q delay and 46% CLK-Q delay owing to the use of a high-speed D-Q path and clock-gating, compared with the state-of-the-art 3NU-recoverable latch (TNURL) that is not 4NU-recoverable.
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Dates and versions

lirmm-03380011 , version 1 (15-10-2021)

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Aibin Yan, Aoran Cao, Zhengzheng Fan, Zhelong Xu, Tianming Ni, et al.. A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments. GLVLSI 2021 - 31st ACM Great Lakes Symposium on VLSI, Jun 2021, Virtual, United States. pp.301-306, ⟨10.1145/3453688.3461493⟩. ⟨lirmm-03380011⟩
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