A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments
Abstract
This paper proposes a 4-node-upset (4NU) recoverable and high-impedance-state (HIS) insensitive latch design, namely QRHIL, for highly robust computing in harsh radiation environments. The latch mainly comprises a 5×5 looped C-element matrix to store values and provide complete 4NU recovery. Owing to the multiple-level error-interception of the 5×5 C-element matrix, the latch can recover from all possible 4NUs; thus, the latch is insensitive to HIS. Simulation results demonstrate the 4NU-recovery of the proposed latch. The results also show that the latch can approximately save 46% D-Q delay and 46% CLK-Q delay owing to the use of a high-speed D-Q path and clock-gating, compared with the state-of-the-art 3NU-recoverable latch (TNURL) that is not 4NU-recoverable.
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