A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2022

A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications

Aibin Yan
Jie Cui
Zhengfeng Huang
Xiaoqing Wen

Abstract

In space, the impact of radiative particles, such as neutrons and heavy ions, can change the node states of a flip-flop, thus resulting in loss of data. In this paper, a Highly reliable and Low power Radiation-hardened-by-design (RHBD) Flip-Flop cell, namely HLRFF, completely hardened against double-node-upsets (DNUs), is proposed for aerospace applications. The HLRFF is a master-slave structure. The master latch is mainly constructed from two 2-input C-elements (CEs) and one 2-input clock-gating based CE, while the slave latch has an additional keeper at the output stage. The verification results demonstrate that the proposed HLRFF is completely DNU-tolerant. Furthermore, compared to the state-of-the-art radiation-hardened FF cells, the proposed HLRFF can reduce power consumption by approximately 69%. However, only the proposed HLRFF is not only completely DNU-tolerant but also insensitive to high-impedance-state.
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Dates and versions

lirmm-03770473 , version 1 (06-09-2022)

Identifiers

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Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, et al.. A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. VTS 2022 - IEEE 40th VLSI Test Symposium, Apr 2022, San Diego, CA, United States. pp.1-6, ⟨10.1109/VTS52500.2021.9794197⟩. ⟨lirmm-03770473⟩
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