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Conference Papers Year : 2010

Predicting dynamic specifications of ADCs with a low-quality digital input signal

Xiaoqin Sheng
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  • PersonId : 1192343
Vincent Kerzérho
Hans G. Kerkhoff
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  • PersonId : 1192344

Abstract

A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A noisy and nonlinear pulse is applied as the test stimulus, which is suitable for a multi-site test environment. The dynamic parameters are predicted using a machine-learning-based approach. A training step is required in order to build the mapping function using alternate signatures and the conventional test parameters, all measured on a set of converters. As a result, for industrial testing, only a simple signature-based test is performed on the Devices-Under-Test (DUTs). The signature measurements are provided to the mapping function that is used to predict the conventional dynamic parameters. The method is validated by simulation on a 12-bit 80 Ms/s pipelined ADC with a pulse wave input signal of 3 LSB noise and 7-bit nonlinear rising and falling edges. The final results show that the estimated mean error is less than 4% of the full range of the dynamic specifications.
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Dates and versions

lirmm-03867080 , version 1 (23-11-2022)

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Xiaoqin Sheng, Vincent Kerzérho, Hans G. Kerkhoff. Predicting dynamic specifications of ADCs with a low-quality digital input signal. ETS 2010 - 15th IEEE European Test Symposium, May 2010, Praha, Czech Republic. pp.158-163, ⟨10.1109/ETSYM.2010.5512764⟩. ⟨lirmm-03867080⟩
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