A Novel Test Flow for Approximate Digital Circuits
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Conference Papers
Year : 2020
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-03993654
Submitted on : Friday, February 17, 2023-9:28:50 AM
Last modification on : Friday, March 24, 2023-2:53:31 PM
Long-term archiving on: Thursday, May 18, 2023-6:15:20 PM
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Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio. A Novel Test Flow for Approximate Digital Circuits. DATE 2020 - EDAA/IEEE/ACM Design Automation & Test in Europe Conference, PhD Forum, Mar 2020, Grenoble, France. ⟨lirmm-03993654⟩
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