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Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2023

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

Abstract

On-line performance monitoring of RF integrated circuits throughout their operating lifetime is a promising way to enhance their reliability. This paper explores the feasibility of adapting the indirect test strategy to implement on-line RF performance monitoring. After stating the principle of the proposed solution, we consider the fundamental requirements necessary to adapt the indirect test strategy. Finally, a proof of concept is established through a practical case of study by monitoring the power level delivered by the RF transmitter of a wireless microcontroller: hardware measurement results demonstrate the potential of this approach.
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Dates and versions

lirmm-04080259 , version 1 (24-04-2023)

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Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. Journal of Electronic Testing: : Theory and Applications, 2023, 39, pp.155-170. ⟨10.1007/s10836-023-06058-7⟩. ⟨lirmm-04080259⟩
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