A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles IEEE Design & Test Year : 2023

A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications

Yuting He
  • Function : Author
  • PersonId : 1292941
Jie Cui
Tianming Ni
Zhengfeng Huang
Xiaoqing Wen

Abstract

This article proposes a robust and low power flip-flop cell with complete double-node-upset (DNU) tolerance for aerospace applications. The proposed cell is constructed from a master latch and a slave latch. The master latch comprises two C-elements as well as one clock-controlled C-element; the slave latch is similar to the master but has an extra keeper to avoid high-impedance state of the output-level C-element. The proposed cell can provide complete DNU-tolerance while reducing power dissipation by 65x0025; on average when compared with existing radiation-hardened flip-flop cells.
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Dates and versions

lirmm-04236363 , version 1 (10-10-2023)

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Cite

Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, et al.. A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications. IEEE Design & Test, 2023, 40 (4), pp.34-41. ⟨10.1109/MDAT.2023.3267747⟩. ⟨lirmm-04236363⟩
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