A Low Overhead and Double-Node-Upset Self-Recoverable Latch - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2023

A Low Overhead and Double-Node-Upset Self-Recoverable Latch

Fan Xia
  • Function : Author
Tianming Ni
Jie Cui
Zhengfeng Huang
Xiaoqing Wen


With the rapid advancement of semiconductor technologies, integrated circuits, especially storage elements (e.g., latches) have become increasingly vulnerable to soft errors. In order to effectively tolerate double-node-upsets (DNUs) caused by radiation and reduce the delay and area of latches, this paper proposes a DNU self-recoverable latch with low overhead in terms of power and area. The proposed latch mainly comprises seven 2-input C-elements and two inverters to achieve DNU self-recovery. Simulation results show that the proposed latch can recover from all possible DNUs and that it can reduce delay by 45.71%, power by 29.13%, area by 65.93%, and areapower-delay-product by 87.42% on average compared to typical existing DNU self-recoverable latches.
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Dates and versions

lirmm-04241214 , version 1 (13-10-2023)


  • HAL Id : lirmm-04241214 , version 1


Aibin Yan, Fan Xia, Tianming Ni, Jie Cui, Zhengfeng Huang, et al.. A Low Overhead and Double-Node-Upset Self-Recoverable Latch. ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan. ⟨lirmm-04241214⟩
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