Minimizing Test Power in SRAM through Pre-charge Activity Reduction

Luigi Dilillo 1 Paul Rosinger 2 Patrick Girard 1 Bashir Al-Hashimi 2
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 ECS Department - University of Southampton
Abstract : Reducing power dissipation during testing of complex integrated circuits (IC) or system-on-chip (SOC) has been acknowledged as a major concern. Similarly, minimising test power in embedded memories is important since they represent the main contributor to the overall IC power dissipation. In this paper we analyse the test power of SRAM memories and demonstrate that the normal pre-charge activity is not necessary during test mode because of the predictable addressing sequence. We exploit this finding in order to minimise power dissipation during test by eliminating the unnecessary pre-charge activity. This is achieved through a modified pre-charge control circuitry. The efficiency of the proposed solution is validated through extensive Spice simulations.
Type de document :
Communication dans un congrès
SIGDA ACM Press. DATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. ACM/IEEE, Design, Automation and Test in Europe Conference and Exhibition, pp.1159-1165, 2006, 〈10.1109/DATE.2006.244016〉
Liste complète des métadonnées

Littérature citée [14 références]  Voir  Masquer  Télécharger
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00137598
Contributeur : Patrick Girard <>
Soumis le : mercredi 12 avril 2017 - 19:10:58
Dernière modification le : jeudi 24 mai 2018 - 15:59:25
Document(s) archivé(s) le : jeudi 13 juillet 2017 - 14:16:25

Fichier

date.pdf
Fichiers produits par l'(les) auteur(s)

Identifiants

Collections

LIRMM | LIRMM_MIC | MIC | SYSMIC | MIPS | UNIV-MONTPELLIER

Citation

Luigi Dilillo, Paul Rosinger, Patrick Girard, Bashir Al-Hashimi. Minimizing Test Power in SRAM through Pre-charge Activity Reduction. SIGDA ACM Press. DATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. ACM/IEEE, Design, Automation and Test in Europe Conference and Exhibition, pp.1159-1165, 2006, 〈10.1109/DATE.2006.244016〉. 〈lirmm-00137598〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

184

Téléchargements de fichiers

190

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD