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Poster communications

Wireless Wafer Test for Iterative Testing During System Assembly

Ziad Noun 1 Philippe Cauvet 2 Marie-Lise Flottes 3 David Andreu 4 Serge Bernard 3
3 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
4 DEMAR - Artificial movement and gait restoration
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, CRISAM - Inria Sophia Antipolis - Méditerranée
Document type :
Poster communications
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00537849
Contributor : Martine Peridier <>
Submitted on : Friday, November 19, 2010 - 3:18:23 PM
Last modification on : Wednesday, August 28, 2019 - 7:12:02 PM

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  • HAL Id : lirmm-00537849, version 1

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Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, David Andreu, Serge Bernard. Wireless Wafer Test for Iterative Testing During System Assembly. 3D-Test: Testing Three-Dimensional Stacked Integrated Circuits, Nov 2010, Austin, Texas, United States. 1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits, 2010. ⟨lirmm-00537849⟩

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