Abstract : A system and method for wirelessly testing integrated circuits provides a multiple layer interface to wirelessly test integrated circuits. A wireless testing structure for an integrated circuit comprises a wireless transceiver and a wireless test interface. The wireless transceiver is configured to receive test information from a tester and transmit test result information to the tester. The wireless test interface is configured to interface between the wireless transceiver and the integrated circuit. The wireless test interface comprises a media access controller and a test control block. The media access controller is configured to implement a media access control protocol for wireless communication. The test control block is configured to decode test information received from the tester, to trigger a test of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test.
Type de document :
Brevet
Spain, Patent n° : EP 08290891 WO 2010031879 (A1). 2008, pp.N/A
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00767777
Contributeur : Marie-Lise Flottes
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Soumis le : jeudi 20 décembre 2012 - 14:31:24
Dernière modification le : mardi 22 janvier 2019 - 15:24:02
David Andreu, Philippe Cauvet, Marie-Lise Flottes, Ziad Noun, Serge Bernard. System and Method for Wirelessly Testing Integrated Circuits. Spain, Patent n° : EP 08290891 WO 2010031879 (A1). 2008, pp.N/A. 〈lirmm-00767777〉
