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System and Method for Wirelessly Testing Integrated Circuits

David Andreu 1 Philippe Cauvet 2 Marie-Lise Flottes 3 Ziad Noun 4 Serge Bernard 3
1 DEMAR - Artificial movement and gait restoration
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, CRISAM - Inria Sophia Antipolis - Méditerranée
3 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : A system and method for wirelessly testing integrated circuits provides a multiple layer interface to wirelessly test integrated circuits. A wireless testing structure for an integrated circuit comprises a wireless transceiver and a wireless test interface. The wireless transceiver is configured to receive test information from a tester and transmit test result information to the tester. The wireless test interface is configured to interface between the wireless transceiver and the integrated circuit. The wireless test interface comprises a media access controller and a test control block. The media access controller is configured to implement a media access control protocol for wireless communication. The test control block is configured to decode test information received from the tester, to trigger a test of the integrated circuit in response to the decoded test information, and to encode test result information that is generated by the integrated circuit in response to the test.
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00767777
Contributor : Marie-Lise Flottes <>
Submitted on : Thursday, December 20, 2012 - 2:31:24 PM
Last modification on : Wednesday, August 28, 2019 - 7:12:02 PM

Identifiers

  • HAL Id : lirmm-00767777, version 1

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Citation

David Andreu, Philippe Cauvet, Marie-Lise Flottes, Ziad Noun, Serge Bernard. System and Method for Wirelessly Testing Integrated Circuits. Spain, Patent n° : EP 08290891 WO 2010031879 (A1). 2008, pp.N/A. ⟨lirmm-00767777⟩

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