A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2012

A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk

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lirmm-00816589 , version 1 (22-04-2013)

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Patrick Girard, Mohammad Tehranipoor, Junxia Ma. A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk. Journal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.201-214. ⟨10.1007/s10836-011-5268-x⟩. ⟨lirmm-00816589⟩
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