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Conference Papers Year : 2011

Power-Aware Testing and Test Strategies for Low Power Devices

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Micro and nanotechnologies/Microelectronics
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Submitted on : Monday, May 6, 2013-2:37:31 PM

Last modification on : Friday, March 24, 2023-2:52:57 PM

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lirmm-00820698 , version 1 (06-05-2013)

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  • HAL Id : lirmm-00820698 , version 1

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Patrick Girard, Nicola Nicolici, Xiaoqing Wen. Power-Aware Testing and Test Strategies for Low Power Devices. DATE: Design, Automation and Test in Europe, Mar 2011, Grenoble, France. ⟨lirmm-00820698⟩

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