Stochastic model for phase noise measurement from 1-bit signal acquisition

Stéphane David-Grignot 1 Florence Azaïs 1 François Lefevre 2 Laurent Latorre 3
1 TEST - TEST
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
3 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This paper presents a novel method for phase noise measurement from 1-bit acquisition of an analog signal. A stochastic model is developed that permits to establish an analytical relationship between the phase noise level present in the analog signal and the characteristics of the binary data captured with a digital ATE. The technique is validated through both simulations and hardware measurements.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01119368
Contributor : Florence Azais <>
Submitted on : Monday, February 23, 2015 - 9:56:43 AM
Last modification on : Wednesday, May 8, 2019 - 2:56:01 PM

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Stéphane David-Grignot, Florence Azaïs, François Lefevre, Laurent Latorre. Stochastic model for phase noise measurement from 1-bit signal acquisition. IMS3TW'14: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. pp.1-6, ⟨10.1109/IMS3TW.2014.6997400⟩. ⟨lirmm-01119368⟩

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