Stochastic model for phase noise measurement from 1-bit signal acquisition

Abstract : This paper presents a novel method for phase noise measurement from 1-bit acquisition of an analog signal. A stochastic model is developed that permits to establish an analytical relationship between the phase noise level present in the analog signal and the characteristics of the binary data captured with a digital ATE. The technique is validated through both simulations and hardware measurements.
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Communication dans un congrès
IMS3TW'14: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. IEEE, pp.1-6, 〈10.1109/IMS3TW.2014.6997400〉
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-01119368
Contributeur : Florence Azais <>
Soumis le : lundi 23 février 2015 - 09:56:43
Dernière modification le : jeudi 11 janvier 2018 - 06:27:19

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Stephane David-Grignot, Florence Azaïs, François Lefevre, Laurent Latorre. Stochastic model for phase noise measurement from 1-bit signal acquisition. IMS3TW'14: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. IEEE, pp.1-6, 〈10.1109/IMS3TW.2014.6997400〉. 〈lirmm-01119368〉

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