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Conference Papers Year : 2014

Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approach

Abstract

Laser shots on secure ICs have proven to be a very effective mean to perform fault attacks. As depicted in Figure 1, due to photo-electric effects, laser can induce transient pulses on gate output and thus generate faults in downstream registers. It is therefore essential for designers of secure devices to have a CAD environment to check the resistance of the circuits against laser attacks and/or to validate the effectiveness of countermeasures during early stage of the design cycle without requiring actually manufacturing some prototype. In this paper we present a complete environment for modeling and simulating the laser effects on circuits during the synthesis step. It takes into account laser parameters and relies on circuit layout information.

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Dates and versions

lirmm-01119614 , version 1 (23-02-2015)

Identifiers

  • HAL Id : lirmm-01119614 , version 1

Cite

Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approach. TRUDEVICE Workshop, May 2014, Paderborn, Germany. ⟨lirmm-01119614⟩
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