Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approach

Feng Lu 1 Giorgio Di Natale 1 Marie-Lise Flottes 1 Bruno Rouzeyre 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Laser shots on secure ICs have proven to be a very effective mean to perform fault attacks. As depicted in Figure 1, due to photo-electric effects, laser can induce transient pulses on gate output and thus generate faults in downstream registers. It is therefore essential for designers of secure devices to have a CAD environment to check the resistance of the circuits against laser attacks and/or to validate the effectiveness of countermeasures during early stage of the design cycle without requiring actually manufacturing some prototype. In this paper we present a complete environment for modeling and simulating the laser effects on circuits during the synthesis step. It takes into account laser parameters and relies on circuit layout information.
Keywords : Laser effect
Type de document :
Communication dans un congrès
TRUDEVICE'2014: Test and Fault Tolerance for Secure Devices, May 2014, Paderborn, Germany. 2014
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Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approach. TRUDEVICE'2014: Test and Fault Tolerance for Secure Devices, May 2014, Paderborn, Germany. 2014. 〈lirmm-01119614〉

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