Fernanda Lima Kastensmidt, Jorge Tonfat, Thiago Both, Paolo Rech, Gilson Wirth, et al.. Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAs.
ETS: European Test Symposium, May 2014, Paderborn, Germany.
⟨10.1109/ETS.2014.6847845⟩.
⟨lirmm-01421128⟩