A Case Study on the Approximate Test of Integrated Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2016
No file

Dates and versions

lirmm-01718609 , version 1 (27-02-2018)

Identifiers

  • HAL Id : lirmm-01718609 , version 1

Cite

Imran Wali, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio. A Case Study on the Approximate Test of Integrated Circuits. AC: Approximate Computing, Oct 2016, Pittsburgh, PA, United States. ⟨lirmm-01718609⟩
141 View
0 Download

Share

Gmail Facebook X LinkedIn More