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Electromagnetic Fault Injection : How Faults Occur

Mathieu Dumont 1, 2 Mathieu Lisart 1 Philippe Maurine 2
2 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Electromagnetic Fault Injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Among them, the most interesting is probably its ability to generate faults in Systems on Chips without removing the package, and this even if only the frontside is exposed to the EM field. Despite this popularity, there is only little information on how EMFI generates faults. Within this context, this paper first aims at filling this lack by proposing a complete modeling of EM induction fault mechanism. In a second step, the introduced model is confronted to experimental data in order to demonstrate its soundness.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-02328109
Contributor : Philippe Maurine <>
Submitted on : Wednesday, October 23, 2019 - 10:08:15 AM
Last modification on : Thursday, October 24, 2019 - 1:34:10 AM

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Mathieu Dumont, Mathieu Lisart, Philippe Maurine. Electromagnetic Fault Injection : How Faults Occur. FDTC: Fault Diagnosis and Tolerance in Cryptography, Aug 2019, Atlanta, GA, United States. pp.9-16, ⟨10.1109/FDTC.2019.00010⟩. ⟨lirmm-02328109⟩

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