Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2023

Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness

Aibin Yan
Yu Chen
  • Function : Author
Shaojie Wei
  • Function : Author
  • PersonId : 1161771
Jie Cui
Zhengfeng Huang
Xiaoqing Wen

Abstract

As CMOS processes continue to shrink, nano-scale CMOS latches have become increasingly sensitive to multiplenode upset (MNU) errors caused by radiation. To tolerate MNU, a novel quadruple-node-upset (QNU) self-recoverable latch is proposed in this paper. The proposed latch is mainly constructed from six blocks of three-level C-elements (TLCEs) and six inverters. With the mutual feedback of the various TLCEs, the proposed latch can recover from any QNU. Furthermore, due to the clock gating methodology and a highspeed transmission path, the proposed latch has lower overhead in terms of power dissipation and transmission delay. Simulation results show that the proposed latch achieves high reliability with moderate overhead compared to typical existing latches.
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Dates and versions

lirmm-04240494 , version 1 (13-10-2023)

Identifiers

  • HAL Id : lirmm-04240494 , version 1

Cite

Aibin Yan, Yu Chen, Shaojie Wei, Jie Cui, Zhengfeng Huang, et al.. Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. ITC-Asia 2023 - IEEE International Test Conference in Asian, Sep 2023, Matsue, Japan. ⟨lirmm-04240494⟩
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