Test and Diagnosis of Integrated Circuits

Alberto Bosio 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : The ever-increasing growth of the semiconductor market results in an increasing complexity of digital circuits. Smaller, faster, cheaper and low-power consumption are the main challenges in semiconductor industry. The reduction of transistor size and the latest packaging technology (i.e., System-On-a-Chip, System-In-Package, Trough Silicon Via 3D Integrated Circuits) allows the semiconductor industry to satisfy the latest challenges. Although producing such advanced circuits can benefit users, the manufacturing process is becoming finer and denser, making chips more prone to defects. The work presented in the HDR manuscript addresses the challenges of test and diagnosis of integrated circuits. It covers: - Power aware test; - Test of Low Power Devices; - Fault Diagnosis of digital circuits.
Document type :
Habilitation à diriger des recherches
Complete list of metadatas

Cited literature [151 references]  Display  Hide  Download

https://hal-lirmm.ccsd.cnrs.fr/tel-01368840
Contributor : Alberto Bosio <>
Submitted on : Tuesday, September 20, 2016 - 10:25:57 AM
Last modification on : Friday, March 22, 2019 - 3:12:02 PM

Identifiers

  • HAL Id : tel-01368840, version 1

Collections

Citation

Alberto Bosio. Test and Diagnosis of Integrated Circuits. Micro and nanotechnologies/Microelectronics. Université de Montpellier 2, 2015. ⟨tel-01368840⟩

Share

Metrics

Record views

704

Files downloads

286